以学术口吻翻译：基于弱电子束高分辨成像技术卤素钙钛矿薄膜缺陷及器件界面研究

基于弱电子束的高分辨率成像技术对于研究卤素钙钛矿薄膜中的缺陷以及器件界面具有重要的学术意义。此项技术能够揭示材料微观结构的细节，增进我们对薄膜生长机理的理解，以及对过程中可能发生的异常如何影响器件性能的认识。

翻译成英文为： The high-resolution imaging technology based on a weak electron beam plays a significant academic role in the study of defects in halide perovskite thin films and the interface of devices. This technology is capable of revealing the microscopic structure detail of materials, enhancing our understanding of the film growth mechanism and recognizing how abnormalities that occur during the process might affect device performance.